Macquarie University Microscopy Unit
Faculty of Science

 

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Transmission Electron Microscopy

Scanning Electron Microscopy

Laser Scanning Confocal Microscopy

Light Microscopy and digital image capture

Histology

Bookings (registered users only)

JEOL JSM- 6480 LA SCANNING ELECTRON MICROSCOPE with EX-23000 BU ENERGY DISPERSIVE X-RAY ANALYSER

This variable pressure SEM system equipped with EDS analytical facilities was commissioned in the Microscopy Unit in October 2005. The scanning electron microscope enables morphological observation of ultrastructure. In secondary electron image mode, the SEM is capable of a maximum resolution of 4nm. The SEM permits not only the observation of very fine detail but is also useful for creating sharp, in-focus images of specimens with considerable height variation due to the large depth of field. Images of objects ranging in size from those visible to the naked eye, to structures as small as several nanometers can be produced. 

 

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JEOL JSM- 7100F FIELD EMISSION SCANNING ELECTRON MICROSCOPE

The JSM 7100-F is a general purpose Field Emission Scanning Electron Microscope allowing for high resolution imaging. Structures as small as a few nanometers can be observed using relatively low accelerating voltages. The JSM -7100F employs a Gentle Beam mode that effectively suppresses charging in nonconductive specimens such as insulating materials including ceramics and semiconductors. The optics developed for nanostructure characterization make routine observation at magnifications higher than 100,000X possible.  Low electron beam energy can be used for the observation of fine surface structures of uncoated biological samples. 

The FESEM is fitted with a Kleindiek MM3A-EM Micromanipulator, the latest tool for high precision in-situ nanomanipulation. The microgripper plugin provides a high-resolution (20nm) gripping solution for transportation of specimens while the rotational tip can be inserted into the front of the axis and rotated with an accuracy of 0.1 degrees per step. In addition to other probing functions, the microgripper can be combined with the rotational tip to allow gripped objects to be rotated. Welding or soldering of two objects is also possible within the FE-SEM.

QUORUM Q150T SPUTTER COATER/TURBO EVAPOURATOR

For carbon evaporative coating and chromium or gold sputter coating.

 

 

EMITECH K550 GOLD SPUTTER COATER UNIT

Gold coating of samples for SEM.

 

EMITECH K850 CRITICAL POINT DRYER

Drying of biological samples for SEM.