JEOL JSM- 7100F FIELD EMISSION SCANNING ELECTRON MICROSCOPE
The JSM 7100-F is a general purpose Field Emission Scanning Electron Microscope enabling high resolution imaging. Structures as small as a few nanometers can be observed using relatively low accelerating voltages. The JSM -7100F employs a Gentle Beam mode that effectively suppresses charging in nonconductive specimens such as insulating materials including ceramics and semiconductors. The optics developed for nanostructure characterization make routine observation at magnifications higher than 100,000X possible. Low electron beam energy can be used for the observation of fine surface structures of uncoated biological samples.
The FESEM is fitted with a Kleindiek MM3A-EM Micromanipulator, the latest tool for high precision in-situ nanomanipulation. The microgripper plugin provides a high-resolution (20nm) gripping solution for transportation of specimens while the rotational tip can be inserted into the front of the axis and rotated with an accuracy of 0.1 degrees per step. In addition to other probing functions, the microgripper can be combined with the rotational tip to allow gripped objects to be rotated. Welding or soldering of two objects is also possible within the FE-SEM.